Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces G. Kaupp

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TextLanguage: Eng Series: Nanoscience and technologyPublication details: Berlin Springer-Verlag, 2006.Description: 292 p. illISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	IISER Central Library Second Floor- Left Wing	502.82 KAU-A (Browse shelf(Opens below))	Available		0001843

Includes bibliographical references and index.

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