MARC details
| 000 -LEADER |
|---|
| fixed length control field |
01163cam a22003257a 4500 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
inmoiis |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20170607122333.0 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
3540284052 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9783540284055 |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
inmoiis |
| 041 ## - LANGUAGE CODE |
|---|
| Language code of text/sound track or separate title |
Eng |
| 044 ## - COUNTRY OF PUBLISHING/PRODUCING ENTITY CODE |
|---|
| MARC country code |
GR |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
502.82 |
| Edition number |
22 |
| Item number |
KAU-A |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Kaupp, G. |
| Fuller form of name |
(Gerd) |
| 9 (RLIN) |
2585 |
| 245 10 - TITLE STATEMENT |
|---|
| Title |
Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : |
| Remainder of title |
application to rough and natural surfaces |
| Statement of responsibility, etc |
G. Kaupp |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
|---|
| Place of publication, distribution, etc |
Berlin |
| Name of publisher, distributor, etc |
Springer-Verlag, |
| Date of publication, distribution, etc |
2006. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
292 p. |
| Other physical details |
ill. |
| 440 #0 - SERIES STATEMENT/ADDED ENTRY--TITLE |
|---|
| Title |
Nanoscience and technology, |
| International Standard Serial Number |
1434-4904 |
| 9 (RLIN) |
2586 |
| 500 ## - GENERAL NOTE |
|---|
| General note |
Includes bibliographical references and index. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Science |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Atomic force microscopy. |
| 9 (RLIN) |
2210 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Near-field microscopy. |
| 9 (RLIN) |
2587 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Nanoscratching |
| 9 (RLIN) |
2588 |
| 856 42 - ELECTRONIC LOCATION AND ACCESS |
|---|
| Uniform Resource Identifier |
<a href="http://www.loc.gov/catdir/enhancements/fy0823/2006923691-d.html">http://www.loc.gov/catdir/enhancements/fy0823/2006923691-d.html</a> |
| 856 41 - ELECTRONIC LOCATION AND ACCESS |
|---|
| Uniform Resource Identifier |
<a href="http://www.loc.gov/catdir/enhancements/fy0823/2006923691-t.html">http://www.loc.gov/catdir/enhancements/fy0823/2006923691-t.html</a> |
| 902 ## - LOCAL DATA ELEMENT B, LDB (RLIN) |
|---|
| 0 |
|
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Source of classification or shelving scheme |
Dewey Decimal Classification |
| Item type |
Books |
