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Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching :

Kaupp, G.

Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces G. Kaupp - Berlin Springer-Verlag, 2006. - 292 p. ill. - Nanoscience and technology, 1434-4904 .

Includes bibliographical references and index.

ISBN: 3540284052 9783540284055

Subjects--Topical Terms:
Science
Atomic force microscopy.
Near-field microscopy.
Nanoscratching

Dewey Class. No.: 502.82 / KAU-A

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