Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces G. Kaupp
Material type:![Text](/opac-tmpl/lib/famfamfam/BK.png)
- 3540284052
- 9783540284055
- 502.82 22 KAU-A
Item type | Current library | Call number | Status | Date due | Barcode |
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IISER Central Library Second Floor- Left Wing | 502.82 KAU-A (Browse shelf(Opens below)) | Available | 0001843 |
Includes bibliographical references and index.
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