Novel Application of Anomalous (Resonance) X-ray Scattering for Structural Characterization of Disordered Materials [electronic resource] / edited by Yoshio Waseda.

Contributor(s):

Material type: Text

TextSeries: Lecture Notes in Physics ; 204Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 1984Description: VI, 186 p. online resourceContent type:

text

Media type:

computer

Carrier type:

online resource

ISBN:

9783540389101

Subject(s):

Additional physical formats: Printed edition:: No title; Printed edition:: No titleDDC classification:

548 23

LOC classification:

QD901-999

Online resources:

Click here to access online

Contents:

A brief background of the present requirement for structural characterization of disordered materials -- Fundamental relationships between rdf and scattering intensity -- Definition of partial structure factors and compositional short range order (CSRO) -- Experimental determination of partial structural functions -- Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials -- Theoretical aspects on the anomalous dispersion factors of x-rays -- Experimental determination of the anomalous dispersion factors -- Selected examples of structural determination using anomalous (resonance) x-ray scattering -- Relative merits of anomalous x-ray scattering and its future prospects.

In: Springer eBooks

Tags from this library: No tags from this library for this title. Log in to add tags.

No physical items for this record

There are no comments on this title.

to post a comment.