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Novel Application of Anomalous (Resonance) X-ray Scattering for Structural Characterization of Disordered Materials [electronic resource] / edited by Yoshio Waseda. - VI, 186 p. online resource. - Lecture Notes in Physics, 204 0075-8450 ; . - Lecture Notes in Physics, 204 .

A brief background of the present requirement for structural characterization of disordered materials -- Fundamental relationships between rdf and scattering intensity -- Definition of partial structure factors and compositional short range order (CSRO) -- Experimental determination of partial structural functions -- Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials -- Theoretical aspects on the anomalous dispersion factors of x-rays -- Experimental determination of the anomalous dispersion factors -- Selected examples of structural determination using anomalous (resonance) x-ray scattering -- Relative merits of anomalous x-ray scattering and its future prospects.

ISBN: 9783540389101

Standard No.: 10.1007/BFb0025745 doi

Subjects--Topical Terms:
Crystallography.
Mineralogy.
Materials.
Crystallography and Scattering Methods.
Mineralogy.
Materials Science, general.

LC Class. No.: QD901-999

Dewey Class. No.: 548