Scanning probe microscopy: atomic scale engineering by forces and currents/ A. Foster

By:

Contributor(s):

Material type: Text

TextLanguage: Eng Series: Nanoscience and technologyPublication details: New York: Springer Science+Business, c2006.Description: 281 p.: illISBN:

Subject(s):

DDC classification:

Online resources:

Tags from this library: No tags from this library for this title. Log in to add tags.

Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	IISER Central Library Second Floor- Left Wing	502.82 FOS-S (Browse shelf(Opens below))	Available		0002316

Includes bibliographical references and index.

There are no comments on this title.

to post a comment.