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Scanning probe microscopy:

Foster, A.

Scanning probe microscopy: atomic scale engineering by forces and currents/ A. Foster - New York: Springer Science+Business, c2006. - 281 p.: ill. - Nanoscience and technology .

Includes bibliographical references and index.

ISBN: 9780387400907

Subjects--Topical Terms:
Science
Scanning probe microscopy.
STM setup
Topological images

Dewey Class. No.: 502.82 / FOS-S

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