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Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces G. Kaupp by
  • Kaupp, G. (Gerd)
Series: Nanoscience and technology
Material type: Text Text
Language: Eng
Publication details: Berlin Springer-Verlag, 2006
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Availability: Items available for loan: IISER Central Library (1)Call number: 502.82 KAU-A.
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Scanning probe microscopy: atomic scale engineering by forces and currents/ A. Foster by
  • Foster, A
  • Hofer, Werner
Series: Nanoscience and technology
Material type: Text Text
Language: Eng
Publication details: New York: Springer Science+Business, c2006
Online access:
Availability: Items available for loan: IISER Central Library (1)Call number: 502.82 FOS-S.
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