000 01163cam a22003257a 4500
003 inmoiis
005 20170607122333.0
020 _a3540284052
020 _a9783540284055
040 _ainmoiis
041 _aEng
044 _aGR
082 0 4 _a502.82
_222
_bKAU-A
100 1 _aKaupp, G.
_q(Gerd)
_92585
245 1 0 _aAtomic force microscopy, scanning nearfield optical microscopy and nanoscratching :
_bapplication to rough and natural surfaces
_cG. Kaupp
260 _aBerlin
_bSpringer-Verlag,
_c2006.
300 _a292 p.
_bill.
440 0 _aNanoscience and technology,
_x1434-4904
_92586
500 _aIncludes bibliographical references and index.
650 0 _aScience
650 0 _aAtomic force microscopy.
_92210
650 0 _aNear-field microscopy.
_92587
650 0 _aNanoscratching
_92588
856 4 2 _uhttp://www.loc.gov/catdir/enhancements/fy0823/2006923691-d.html
856 4 1 _uhttp://www.loc.gov/catdir/enhancements/fy0823/2006923691-t.html
902 _0IISER Mohali
942 _2ddc
_cBK
999 _c882
_d882