| 000 | 00789nam a22002897a 4500 | ||
|---|---|---|---|
| 999 |
_c8036 _d8036 |
||
| 003 | inmoiis | ||
| 005 | 20190722151625.0 | ||
| 020 | _a9780306472923 | ||
| 040 | _ainmoiis | ||
| 041 | _aEng | ||
| 044 | _aXXU | ||
| 082 |
_222 _a502.825 _bGOL-S |
||
| 100 | _aGoldstein, Joseph | ||
| 245 |
_aScanning Electron Microscopy and X-Ray Microanalysis _cJoseph Goldstein |
||
| 250 | _a3rd. | ||
| 260 |
_aUSA _bSpringer _c2003 |
||
| 300 |
_a690 p. _bill. |
||
| 500 | _aInclude Reference and index | ||
| 650 | _aX-ray microanalysis | ||
| 650 | _aScanning electron microscopy | ||
| 650 | _aMicroscopy | ||
| 650 | _aNanotechnology | ||
| 700 | _aNewbury, Dale ; Joy, david ; Lyman, Charles ; Echlin, Patrick ; Lifshin, Eric | ||
| 902 | _01 | ||
| 942 | _cBK | ||