000 | 01142cam a22003257a 4500 | ||
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999 |
_c1151 _d1151 |
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003 | inmoiis | ||
005 | 20211228212003.0 | ||
020 | _a9780387400907 | ||
040 |
_ainmoiis _dIISER Mohali |
||
041 | _aEng | ||
044 | _aXXU | ||
082 | 0 | 0 |
_a502.82 _222 _bFOS-S |
100 | 1 |
_aFoster, A. _92575 |
|
245 | 1 | 0 |
_aScanning probe microscopy: _batomic scale engineering by forces and currents/ _cA. Foster |
260 |
_aNew York: _bSpringer Science+Business, _cc2006. |
||
300 |
_a281 p.: _bill. |
||
440 | 0 |
_aNanoscience and technology _92576 |
|
500 | _aIncludes bibliographical references and index. | ||
650 | 0 | _aScience | |
650 | 0 |
_aScanning probe microscopy. _92577 |
|
650 | 0 |
_aSTM setup _92578 |
|
650 | 0 |
_aTopological images _92579 |
|
700 | 1 |
_aHofer, Werner _92580 |
|
856 | 4 | 2 | _uhttp://www.loc.gov/catdir/enhancements/fy0817/2005936713-d.html |
856 | 4 | 1 | _uhttp://www.loc.gov/catdir/enhancements/fy0817/2005936713-t.html |
902 | _01 | ||
942 |
_2ddc _cBK |