000 01142cam a22003257a 4500
999 _c1151
_d1151
003 inmoiis
005 20211228212003.0
020 _a9780387400907
040 _ainmoiis
_dIISER Mohali
041 _aEng
044 _aXXU
082 0 0 _a502.82
_222
_bFOS-S
100 1 _aFoster, A.
_92575
245 1 0 _aScanning probe microscopy:
_batomic scale engineering by forces and currents/
_cA. Foster
260 _aNew York:
_bSpringer Science+Business,
_cc2006.
300 _a281 p.:
_bill.
440 0 _aNanoscience and technology
_92576
500 _aIncludes bibliographical references and index.
650 0 _aScience
650 0 _aScanning probe microscopy.
_92577
650 0 _aSTM setup
_92578
650 0 _aTopological images
_92579
700 1 _aHofer, Werner
_92580
856 4 2 _uhttp://www.loc.gov/catdir/enhancements/fy0817/2005936713-d.html
856 4 1 _uhttp://www.loc.gov/catdir/enhancements/fy0817/2005936713-t.html
902 _01
942 _2ddc
_cBK