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Scanning Electron Microscopy and X-Ray Microanalysis

Goldstein, Joseph

Scanning Electron Microscopy and X-Ray Microanalysis Joseph Goldstein - 3rd. - USA Springer 2003 - 690 p. ill.

Include Reference and index

ISBN: 9780306472923

Subjects--Topical Terms:
X-ray microanalysis
Scanning electron microscopy
Microscopy
Nanotechnology

Dewey Class. No.: 502.825 / GOL-S

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